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Boundary scan
Results: 183

#	Item
171	IEEE Std[removed]A Standardized Test Access Methodology for Memory Devices 2011 International Test Conference Heiko Ehrenberg Bob Russell Add to Reading List Source URL: grouper.ieee.org Language: English - Date: 2011-09-27 22:34:31 Electronics Technology Standards organizations Boundary scan Joint Test Action Group Institute of Electrical and Electronics Engineers Electronics manufacturing IEEE standards Manufacturing
172	Boundary-Scan Tutorial Boundary-Scan Tutorial Add to Reading List Source URL: www.eet.bme.hu Language: English - Date: 2001-10-24 14:26:06 Electronics Boundary scan Joint Test Action Group Serial Vector Format Functional testing Digital electronics Test Printed circuit board Boundary scan description language Electronics manufacturing Manufacturing Electronic engineering
173	www.xjtag.com Design & Test Guidelines Add to Reading List Source URL: www.xjtag.com Language: English - Date: 2013-08-13 06:02:06 Electronic engineering IEEE standards Embedded systems Joint Test Action Group Boundary scan Microcontrollers Standards organizations RS-232 Daisy chain Electronics manufacturing Manufacturing Electronics
174	Tecnobit www.xjtag.com Add to Reading List Source URL: www.xjtag.com Language: English - Date: 2010-10-19 07:41:22 Technology Boundary scan Joint Test Action Group Automated X-ray inspection Test engineer Functional testing Corelis Design for testing Electronics manufacturing Manufacturing Electronics
175	Xilinx XAPP503, SVF and XSVF File Formats for Xilinx Devices, Application Note Add to Reading List Source URL: www.xilinx.com Language: English - Date: 2013-03-04 06:00:09 Electronic engineering Serial Vector Format Joint Test Action Group Boundary scan Xilinx Datapath Electronics manufacturing Manufacturing Electronics
176	Boundary-Scan Integrazione dell’architettura boundary-scan nella piattaforma NI Add to Reading List Source URL: www.ni.com Language: Italian - Date: 2002-05-16 12:06:46
177	Breakthrough silicon scanning discovers backdoor in military chip (DRAFT of 05 March[removed]Sergei Skorobogatov Add to Reading List Source URL: www.cl.cam.ac.uk Language: English - Date: 2012-05-28 09:08:30 Electronics manufacturing Manufacturing IEEE standards Microcontrollers Joint Test Action Group Power analysis Boundary scan Field-programmable gate array TI MSP430 Electronics Electronic engineering Embedded systems
178	PDF Document Add to Reading List Source URL: tree.celinuxforum.org Language: English - Date: 2009-04-10 15:41:16 Electronic engineering Joint Test Action Group Boundary scan description language Boundary scan Serial Vector Format Atmel AVR Electronics manufacturing Manufacturing Electronics
179	5990-3736EN[removed]indd Add to Reading List Source URL: cp.literature.agilent.com Language: English - Date: 2009-03-02 21:24:23 In-circuit test Agilent Technologies Test engineer Circuit Check Test fixture Boundary scan Electronics manufacturing Manufacturing Technology
180	PDF Document Add to Reading List Source URL: hybridmemorycube.org Language: English - Date: 2013-05-10 12:23:50 Computing Embedded systems Joint Test Action Group Communications protocol I²C Boundary scan Pointer Electronics manufacturing Manufacturing Electronics

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